Nomogram of p and s Reflectances for an Ambient-Film-Substrate System
The experimental setup consists of an ambient-film-substrate system. Linearly polarized light is incident at an angle from air onto a silicon substrate coated with a film of refractive index and normalized thickness . The reflectances for the and polarizations are measured and are verified with the theoretical results from the nomogram.
The figure shows a nomogram that relates and intensity reflectances at an angle of incidence to a varying coating refractive index and the normalized thickness . The reflectances for both polarizations can be read off the axes for any given value of the refractive index and thickness of the film at . Similar nomograms for other material systems at any angle of incidence can be generated.