The experimental setup consists of an ambient-film-substrate system. Linearly polarized light is incident at an angle
from air onto a silicon substrate coated with a film of refractive index
and normalized thickness
. The reflectances for the
and
polarizations are measured and are verified with the theoretical results from the nomogram.
The figure shows a nomogram that relates
and
intensity reflectances at an angle of incidence
to a varying coating refractive index
and the normalized thickness
. The reflectances for both polarizations can be read off the axes for any given value of the refractive index and thickness of the film at
. Similar nomograms for other material systems at any angle of incidence can be generated.
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