Nomogram of p and s Reflectances for an Ambient-Film-Substrate System

The experimental setup consists of an ambient-film-substrate system. Linearly polarized light is incident at an angle from air onto a silicon substrate coated with a film of refractive index and normalized thickness . The reflectances for the and polarizations are measured and are verified with the theoretical results from the nomogram.
The figure shows a nomogram that relates and intensity reflectances at an angle of incidence to a varying coating refractive index and the normalized thickness . The reflectances for both polarizations can be read off the axes for any given value of the refractive index and thickness of the film at . Similar nomograms for other material systems at any angle of incidence can be generated.


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R. M. A. Azzam, "Polarized Light Reflectometer," Applied Optics, 33(25), 1994 pp. 6009–6011.
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